A. Moerman
Terahertz Sensing (THZ), Department of Microelectronics
TIFUUN is an imaging spectrometer for mapping the submillimeter-wave universe in 3DTerahertz Integral Field Unit with Universal Nanotechnology
Moerman, A.; Karatsu, K.; Yates, S. J. C.; Huiting, R.; Steenvoorde, F.; Dabironezare, S. O.; Takekoshi, T.; Baselmans, J. J. A.; Brandl, B. R.; Endo, A.;
Astronomy & Astrophysics,
Volume 684, pp. A161, Apr. 2024.
Akira Endo; Kenichi Karatsu; Tatsuya Takekoshi; Yoichi Tamura; Akio Taniguchi; Matus Rybak; Kotaro Kohno; Hiroki Akamatsu; Javier Aguilera; Tom J. L. C. Bakx; Bruno T. Buijtendorp; Scott Cray; Shahab Dabironezare; Yasunori Fujii; Kazuyuki Fujita; Masato Hagimoto; Shaul Hanany; Shuji Hotta; Robert Huiting; Takahiro Iino; Chihiro Imamura; Shun Ishii; Kotaro Iwakami; Tetsu Kitayama; Kuniaki Konishi; Ryohei Kawabe; Micah Klettke; ;
In Proceedings Volume PC13102, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XII,
2024. DOI: 10.1117/12.3015295
Arend Moerman; Maikel H. Gafaji; Kenichi Karatsu; Akira Endo;
Journal of Open Source Software,
Volume 8, Issue 88, pp. 5247, 2023. DOI: 10.21105/joss.05478
Tjarda C. N. Boekholt; Arend Moerman; Simon F Portegies Zwart;
Phys. Rev. D,
Volume 104, Issue 8, pp. 083020, Oct. 2021.
T.P.M. Cadee; JHW Jacobs; N ten Kate; E.R. Loopstra; A.L.H.J. van Meer; J.J.S.M. Mertens; C.G.M. de Mol; M.J.E.H. Muitjens; A.J. van der Net; J.J. Ottens; J.A. Quaedackers; M.E. Reuhman-huisken; M.K. Stavenga; Marco ;
Patent, United States US20190235397A1, August 2019.
Abstract: ...
A lithographic apparatus is described having a liquid supply system configured to at least partly fill a space between a projection system of the lithographic apparatus and a substrate with liquid, a barrier member arranged to substantially contain the liquid within the space, and a heater.
document
R.M. van Guijt; R. Moerman; A.R. Kroon; G. van DedemWK; R. van den Doel; L. van Vliet; I.T. Young; F.P.J. Laugere; A. Bossche; P.M. Sarro;
Biotechnology Advances: research reviews,
Volume 21, Issue 5, pp. 431-444, 2003. 50/50 EI/ECTM.
I.T. Young; V.P. Iordanov; A.R. Kroon; H.R.C. Dietrich; R. Moerman; L.R. van den Doel; G. van DedemWK; A. Bossche; B.L. Gray; P.M. Sarro; P.W. Verbeek; L. van VlietJ;
Proceedings of SPIE- International Society for Optical Engineering,
Volume 4966, pp. 76-82, 2003.
I.T. Young; R. Moerman; L.R. van den Doel; V.P. Iordanov; A.R. Kroon; H.R.C. Dietrich; G. van DedemWK; A. Bossche; B.L. Gray; P.M. Sarro; P.W. Verbeek; L. van VlietJ;
Journal of Microscopy,
Volume 212, Issue 3, pp. 254-263, 2003. 50/50 EI/ECTM.
B.L. Gray; R. Moerman; L.R. van den Doel; H.R. Dietrich; V.P. Iordanov; N.P. Pham; L.M. Sarro; A. Bossche; M.J. Vellekoop;
In Proc. SPIE: Biomedical Nanotechnology Architectures and Applications,
pp. 103-108, Jan. 2002.
B.L. Gray; R. Moerman; L.R. van den Doel; V.P. Iordanov; N.P. Pham; P.M. Sarro; A. Bossche; M.J. Vellekoop;
In Proc. SESENS 2002,
Veldhoven, The Netherlands, pp. 791-794, Nov. 2002. ISBN 90-73461-28-6.
B.L. Gray; R. Moerman; L.R. van den Doel; H.R.C. Dietrich; V.P. Iordanov; N.P. Pham; P.M. Sarro; A. Bossche; M.J. Vellekoop;
In DJ Bornhop; DA Dunn; RP Mariella; CJ Murphy; DV Nicolau; Shuming Nie; M Palmer; R Raghavachari (Ed.), Biomedical Nanotechnology Architectures and Applications, Proceedings,
SPIE, pp. 103-108, 2002. ISSN 0277-786X, phpub 31.
B.L. Gray; R. Moerman; L.R. van den Doel; V.P. Jordanov; P.N. Pham; P.M. Sarro; A. Bossche; M.J. Vellekoop;
In SAFE - ProRISC - SeSense 2001: proceedings. Semiconductor Advances for Future Eelctornics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology,
STW Technology Foundation, pp. 791-794, 2001.
L.R. van den Doel; M.J. Vellekoop; P.M. Sarro; R. Moerman; J. Frank; G. van DedemWK; K.T. Hjelt; L. van VlietJ; I.T. Young;
In YJ Zhang (Ed.), Proceedings ICIG'2000, First International Conference on Image and Graphics,
pp. 36-41, 2000. ISSN: 1006-8961.
L.R. van den Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; J. Frank; G. van DedemWK; K.T. Hjelt; L. van VlietJ; I.T. Young;
M Ferrari (Ed.);
, pp. 28-39, 1999. ISSN: 0277-786X.
R. Moerman; L.R. van den Doel; S. Picioreanu; J. Frank; J.C.M. Marijnissen; G. van DedemWK; K.T. Hjelt; M.J. Vellekoop; P.M. Sarro; I.T. Young;
M Ferrari (Ed.);
, pp. 119-128, 1999. ISSN: 0277-786X Proc. SPIE, Progress in Biomedical Optics, Vol: 3606.
R. Moerman; L.R. van den Doel; S. Picioreanu; J. Frank; J.C.M. Marijnissen; G. van Dedem; K.T. Hjelt; M J Vellekoop; P M Sarro; I.T. Young;
In Proceedings SPIE,
San Jose, pp. 119-128, Jan. 1999. ISBN 0-8194-3076-5.
L.R. van d. Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; H. Frank; G. van Dedem; K. Hjelt; L.J. van Vliet; I.T. Young;
In Proceedings SPIE,
San Jose, pp. 28-39, Jan. 1999. ISBN 0-8194-3076-5.
R. Moerman; L.R. van den Doel; S. Picioreanu; J. Frank; J.C.M. Marijnissen; G. van Dedem; K.T. Hjelt; M.J. Vellekoop; P.M. Sarro; I.T. Young;
In {M Ferrari} (Ed.), Progress in biomedical optics (Proceedings SPIE 3606),
International Society for Optical Engineering, pp. 119-128, 1999.
L.R. van den Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; J.E. Frank; G. van Dedem; K.T. Hjelt; L. van VlietJ; I.T. Young;
In {M Ferrari} (Ed.), Progress in biomedical optics (Proceedings SPIE 3606),
International Society for Optical Engineering, pp. 28-39, 1999.
L.R. van d. Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; H. Frank; G. van Dedem; K. Hjelt; I.T. Young;
In Proc. 4th Annual Conference of the Advanced School for Computing and Imaging (ASCI 98),
Lommel, Belgium, pp. 58-62, Jun. 1998.
L.R. van den Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; H. Frank; G. van Dedem; K.T. Hjelt; I.T. Young;
In {BM Haar Romeny}, ter; {D.H.J. Epema}; {JFM Tonino}; {AA Wolters} (Ed.), ASCI'98: proceedings,
Advanced School for Computing and Imaging, pp. 58-62, 1998.
L.R. van den Doel; M.J. Vellekoop; P.M. Sarro; S. Picioreanu; R. Moerman; H. Frank; G. van DedemWK; K.T. Hjelt; I.T. Young;
In {ter Haar Romeny}, BM; D.H.J. Epema; JFM Tonino; AA Wolters (Ed.), Proc. ASCI'98, 4th Annual Conf. of the Advanced School for Computing and Imaging,
pp. 58-62, 1998.
C.A.M. Steenbergen; L.C.N. de Vreede; C. van Dam; T.L.M. Scholtes; M.K. Smit; J.L. Tauritz; J.W. Pedersen; I. Moerman; B.H. Verbeek; R.G.F. Baets;
In Proc. ECOC 1995,
Brussels, Belgium, pp. 211-214, Sept. 1995.
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Last updated: 27 May 2024
Arend Moerman
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