MSc Y Shen
Electronic Circuits and Architectures (ELCA), Department of Microelectronics
Promotor: Leo de Vreede, Morteza Alavi
SEEDCOM aims for fully integrated energy efficient wideband transmittersSmart Energy Efficient Digital Communication
Y. Shen; M. Hoogelander; R. Bootsman; M. S. Alavi; L. C. N. de Vreede;
IEEE Journal Solid-State Circuits,
Volume 58, Issue 9, pp. 2489-2500, Sep. 2023. DOI: 10.1109/JSSC.2023.3279235
Beikmirza, Mohammadreza; Shen, Yiyu; de Vreede, Leo C. N.; Alavi, Morteza S.;
IEEE Journal of Solid-State Circuits,
Volume 58, Issue 3, pp. 677-690, 2023. DOI: 10.1109/JSSC.2022.3222028
Shen, Yiyu; Hoogelander, Martijn; Bootsman, Rob; Alavi, Morteza S.; de Vreede, Leo C. N.;
IEEE Journal of Solid-State Circuits,
pp. 1-12, 2023. DOI: 10.1109/JSSC.2023.3279235
Mortazavi, Mohsen; Shen, Yiyu; Mul, Dieuwert; de Vreede, Leo C. N.; Spirito, Marco; Babaie, Masoud;
IEEE Journal of Solid-State Circuits,
Volume 57, Issue 3, pp. 803-817, 2022. DOI: 10.1109/JSSC.2021.3133861
Zhang, Linghan; Shen, Yiyu; de Vreede, Leo; Babaie, Masoud;
IEEE Solid-State Circuits Letters,
Volume 5, pp. 150-153, 2022. DOI: 10.1109/LSSC.2022.3179661
Bootsman, Robert J.; Mul, Dieuwert P. N.; Shen, Yiyu; Hashemi, Mohsen; Heeres, Rob M.; van Rijs, Fred; Alavi, Morteza S.; de Vreede, Leo C. N.;
IEEE Transactions on Microwave Theory and Techniques,
Volume 70, Issue 5, pp. 2835-2850, 2022. DOI: 10.1109/TMTT.2022.3153000
Shen, Yiyu; Bootsman, Robert; Alavi, Morteza S.; de Vreede, Leo C. N.;
IEEE Journal of Solid-State Circuits,
Volume 57, Issue 5, pp. 1446-1456, 2022. DOI: 10.1109/JSSC.2022.3144362
Gao, Zhong; He, Jingchu; Fritz, Martin; Gong, Jiang; Shen, Yiyu; Zong, Zhirui; Chen, Peng; Spalink, Gerd; Eitel, Ben; Alavi, Morteza S.; Staszewski, Robert Bogdan; Babaie, Masoud;
IEEE Journal of Solid-State Circuits,
pp. 1-20, 2022. DOI: 10.1109/JSSC.2022.3209338
Bootsman, Robert; Shen, Yiyu; Mul, Dieuwert; Rousstia, Mohadig; Heeres, Rob; van Rijs, Fred; Gajadharsing, John; Alavi, Morteza S.; de Vreede, Leo C.N.;
In 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022,
pp. 979-982, 2022. DOI: 10.1109/IMS37962.2022.9865405
Beikmirza, Mohammadreza; Shen, Yiyu; de Vreede, Leo C.N.; Alavi, Morteza S.;
In 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022,
pp. 975-978, 2022. DOI: 10.1109/IMS37962.2022.9865506
Beikmirza, Mohammadreza; Shen, Yiyu; de Vreede, Leo C.N.; Alavi, Morteza S.;
In 2022 IEEE Custom Integrated Circuits Conference (CICC),
pp. 01-02, 2022. DOI: 10.1109/CICC53496.2022.9772797
Song, Minyoung; Huang, Yu; Shen, Yiyu; Shi, Chengyao; Breeschoten, Arjan; Konijnenburg, Mario; Visser, Huib; Romme, Jac; Dutta, Barundeb; Alavi, Morteza S.; Bachmann, Christian; Liu, Yao-Hong;
In 2022 IEEE International Solid- State Circuits Conference (ISSCC),
pp. 394-396, 2022. DOI: 10.1109/ISSCC42614.2022.9731608
Gao, Zhong; He, Jingchu; Fritz, Martin; Gong, Jiang; Shen, Yiyu; Zong, Zhirui; Chen, Peng; Spalink, Gerd; Eitel, Ben; Yamamoto, Ken; Staszewski, Robert Bogdan; Alavi, Morteza S.; Babaie, Masoud;
In 2022 IEEE International Solid- State Circuits Conference (ISSCC),
pp. 380-382, 2022. DOI: 10.1109/ISSCC42614.2022.9731561
Beikmirza, Mohammadreza; Shen, Yiyu; de Vreede, Leo C. N.; Alavi, Morteza S.;
IEEE Journal of Solid-State Circuits,
Volume 56, Issue 12, pp. 3768-3783, 2021. DOI: 10.1109/JSSC.2021.3105542
Beikmirza, Mohammadreza; Shen, Yiyu; Mehrpoo, Mohammadreza; Hashemi, Mohsen; Mul, Dieuwert; de Vreede, Leo C.N.; Alavi, Morteza S.;
In 2021 IEEE International Solid- State Circuits Conference (ISSCC),
pp. 92-94, 2021. DOI: 10.1109/ISSCC42613.2021.9365831
Mul, Dieuwert P.N.; Bootsman, Rob J.; Bruinsma, Quinten; Shen, Yiyu; Krause, Sebastian; Quay, Rüdiger; Pelk, Marco J.; van Rijs, Fred; Heeres, Rob M.; Pires, Sergio; Alavi, Morteza; de Vreede, Leo C.N.;
In 2020 50th European Microwave Conference (EuMC),
pp. 1-4, 2021. DOI: 10.23919/EuMC48046.2021.9338122
Mortazavi, Mohsen; Shen, Yiyu; Mul, Dieuwert. P. N.; de Vreede, Leo C. N.; Spirito, Marco; Babaie, Masoud;
In 2021 IEEE Custom Integrated Circuits Conference (CICC),
pp. 1-2, 2021. DOI: 10.1109/CICC51472.2021.9431396
Bootsman, R.J.; Mul, D.P.N.; Shen, Y.; Heeres, R.M.; van Rijs, F.; Alavi, M.S.; de Vreede, L.C.N.;
In 2020 IEEE/MTT-S International Microwave Symposium (IMS),
pp. 1113-1116, 2020. DOI: 10.1109/IMS30576.2020.9223942
Shen, Yiyu; Bootsman, Rob; Alavi, Morteza S.; de Vreede, Leo C.N.;
In 2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
pp. 287-290, 2020. DOI: 10.1109/RFIC49505.2020.9218324
Shen, Yiyu; Bootsman, Rob; Alavi, Morteza S.; de Vreede, Leonardus;
In 2020 IEEE Custom Integrated Circuits Conference (CICC),
pp. 1-4, 2020. DOI: 10.1109/CICC48029.2020.9075949
Yanning Shen; G. Leus; G.B. Giannakis;
IEEE Tr. Signal Processing,
Volume 67, Issue 9, pp. 2471-2483, May 2019. DOI: 10.1109/TSP.2019.2904922
document
Hashemi, Mohsen; Zhou, Lei; Shen, Yiyu; de Vreede, Leo C. N.;
IEEE Transactions on Microwave Theory and Techniques,
Volume 67, Issue 10, pp. 4232-4245, 2019. DOI: 10.1109/TMTT.2019.2933204
Yanning Shen; Geert Leus;
In 2019 IEEE Data Science Workshop (DSW),
IEEE, pp. 83--87, 2019. ISBN: 978-1-7281-0709-7. DOI: 10.1109/DSW.2019.8755782
Abstract: ...
Graphs have well-documented merits for modeling complex systems, including financial, biological, and social networks. Network nodes can also include attributes such as age or gender of users in a social network. However, the size of real-world networks can be massive, and nodal attributes can be unavailable. Moreover, new nodes may emerge over time, and their attributes must be inferred in real time. In this context, the present paper deals with scalable learning of nodal attributes by estimating a nodal function based on noisy observations at a subset of nodes. A multikernel-based approach is developed which is scalable to large-size networks. The novel method is capable of providing real-time evaluation of the function values on newly-joining nodes without resorting to a batch solver. In addition, the novel scheme only relies on an encrypted version of each node's connectivity, which promotes privacy. Experiments on real datasets corroborate the effectiveness of the proposed methods.
document
Mehrpoo, Mohammadreza; Hashemi, Mohsen; Shen, Yiyu; de Vreede, Leo C. N.; Alavi, Morteza S.;
IEEE Journal of Solid-State Circuits,
Volume 53, Issue 5, pp. 1361-1373, 2018. DOI: 10.1109/JSSC.2017.2786685
Yiyu Shen; Michael Polushkin; Mohammad Reza Mehrpoo; Mohsen Hashemi; Earl McCune; Morteza S. Alavi; Leo C. N. de Vreede,;
In (accepted RWS 2018).,
2018.
Shen, Yiyu; Polushkin, Michael; Mehrpoo, Mohammadreza; Hashemi, Mohsen; McCune, Earl; Alavi, Morteza S.; de Vreede, Leo C. N.;
In 2018 IEEE 18th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF),
pp. 8-11, 2018. DOI: 10.1109/SIRF.2018.8304215
Hashemi, Mohsen; Shen, Yiyu; Mehrpoo, Mohammadreza; Alavi, Morteza S.; de Vreede, Leo C. N.;
IEEE Journal of Solid-State Circuits,
Volume 52, Issue 12, pp. 3312-3328, 2017. DOI: 10.1109/JSSC.2017.2737647
M. Hashemi; Y. Shen; M. Mehrpoo; M. Acar; R. van Leuken; M. S. Alavi; L. de Vreede;
In 2017 IEEE International Solid-State Circuits Conference (ISSCC),
pp. 300-301, February 2017. DOI: 10.1109/ISSCC.2017.7870380
document
Y. Shen; M. Mehrpoo; M. Hashemi; M. Polushkin; L. Zhou; M. Acar; R. van Leuken; M. S. Alavi; L. de Vreede;
In 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
pp. 196-199, June 2017. DOI: 10.1109/RFIC.2017.7969051
document
M. Mehrpoo; M. Hashemi; Y. Shen; R. van Leuken; M. S. Alavi; L. C. N. de Vreede;
In 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
pp. 188-191, June 2017. DOI: 10.1109/RFIC.2017.7969049
document
Hashemi, Mohsen; Shen, Yiyu; Mehrpoo, Mohammadreza; Acar, Mustafa; van Leuken, René; Alavi, Morteza S.; de Vreede, Leonardus;
In 2017 IEEE International Solid-State Circuits Conference (ISSCC),
pp. 300-301, 2017. DOI: 10.1109/ISSCC.2017.7870380
Mehrpoo, M.; Hashemi, M.; Shen, Y.; van Leuken, R.; Alavi, M. S.; de Vreede, L. C. N.;
In 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
pp. 188-191, 2017. DOI: 10.1109/RFIC.2017.7969049
Hashemi, Mohsen; Zhou, Lei; Shen, Yiyu; Mehrpoo, Mohammadreza; de Vreede, Leo;
In 2017 IEEE MTT-S International Microwave Symposium (IMS),
pp. 2025-2028, 2017. DOI: 10.1109/MWSYM.2017.8059066
Shen, Yiyu; Mehrpoo, Mohammadreza; Hashemi, Mohsen; Polushkin, Michael; Zhou, Lei; Acar, Mustafa; van Leuken, Rene; Alavi, Morteza S.; de Vreede, Leo;
In 2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
pp. 196-199, 2017. DOI: 10.1109/RFIC.2017.7969051
X P Chen; J K Jiang; Q H Liang; N Yang; Huaiyu Ye; M Cai; L Shen; D G Yang; T L Ren;
Scientific Reports,
Volume 5, pp. 16907, 2015.
Xueming Li; L. Wei; S. Vollebregt; R. Poelma; Y. Shen; Jia Wei; P. Urbach; P.M. Sarro; GuoQi Zhang;
In Transducers,
pp. 2041-2044, 2015.
S.J. Li; C. Shen; P.M. Sarro;
Sensors and Actuators A,
Volume 186, pp. 203-209., Oct. 2012. DOI 10.1016/j.sna.2012.04.027.
C. Shen; V.R.S.S. Mokkapati; H.T.M. Pham; P.M. Sarro;
Journal of Micromechanics and Microengineering,
Volume 22, Issue 2, pp. 1-10., Jan. 2012. DOI 10.1088/0960-1317/22/2/025003.
S.R.K. Malladi; Q. C. Xu Shen; G. Pandraud; F.D. Tichelaar; H.W. Zandbergen;
In The 15th European Microscopy Congress (EMC 2012),
Manchester, UK, pp. 1-2, Sept. 2012.
V.R.S.S. Mokkapati; V. di Virgilio; C. Shen; J. Mollinger; J. Bastemeijer; A. Bossche;
Lab on a Chip,
Volume 11, Issue 16, pp. 2711-2719, 2011.
C. Shen; V.R.S.S. Mokkapati; F. Santagata; A. Bossche; P.M. Sarro;
In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
Beijing, China, pp. 854-857, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969464.
T.S.Y. Moh; Y. Maruyama; C. Shen; G. Pandraud; L.C.P.M. de Smet; H.D. Tong; C. van Rijn; E.J.R. Sudholter; P.M. Sarro;
In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
Beijing, China, pp. 1590-1593, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969796.
S.J. Li; C. Shen; P.M. Sarro;
In C. Tsamis; G. Kaltas (Ed.), Proc. Eurosensors XXV,
Athens, Greece, Procedia Engineering, pp. 1193-1196, Sep. 2011. DOI 10.1016/j.proeng.2011.12.294.
C. Shen; VRSS. Mokkapati; F. Santagata; A. Bossche; P.M. Sarro;
In {Fan et al}, L-S (Ed.), 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
IEEE, pp. 854-857, 2011.
C. Shen; V.R.S.S Mokkapati; F. Santagata; A. Bossche; P.M. Sarro;
In 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference,
IEEE, pp. 854-857, 2011.
C. Shen;
PhD thesis, Delft University of Technology, Nov. 2011. ISBN 978-90-8570-761-5; Promotor: prof.dr. P.M. Sarro.
A.T. Tran; H. Schellevis; C. Shen; H.T.M. Pham; P.M. Sarro;
In Proc. of SAFE 2009,
Veldhoven, The Netherlands, STW, pp. 121-124, 2009.
document
C. Shen; T.M.H. Pham; P.M. Sarro;
In Micro Electro Mechanical Systems,
Sorrento, Italy, pp. 383-386, 2009.
C. Shen; H.T.M. Pham; P.M. Sarro;
In he 15th International Conference on Solid-State Sensors, Actuators and Microsystems, Transducers 2009,
pp. 1071-1074, 2009.
document
E.F. Deprettere; G.J. Hekstra; L.S. Shen; J. Bu; G. Boersma;
In 1996 IEEE Workshop on VLSI Signal Processing,
IEEE, pp. 425-438, October 1994.
Li-Sheng Shen;
PhD thesis, Delft University of Technology, September 1993. ISBN 90-5326-012-9/CIP.
L.S. Shen; E.F. Deprettere; P. Dewilde;
In Advances in Computer Graphics Hardware V,
Berlin, Springer-Verlag, 1992.
L.S. Shen; E.F. Deprettere;
In Proceedings Seventh Eurographics Workshop on Graphics Hardware,
September 1992.
L.S. Shen; E.F. Deprettere;
In Proceedings IEEE International Conference on Computer Systems and Software Engineering,
pp. 244-249, May 1992.
L.S. Shen; E.F. Deprettere;
In Algorithms and Parallel VLSI Architectures,
Amsterdam, North Holland, 1991.
L.S. Shen; F. Laarakker; E.F. Deprettere;
In Proceedings Sixth Eurographics Workshop on Graphics Hardware,
September 1991.
L.S. Shen; E.F. Deprettere; P. Dewilde;
In Proceedings ProRISC/IEEE Symposium,
1991.
L.S. Shen; E.F. Deprettere;
In Proceedings Fifth Eurographics Workshop on Graphics Hardware,
September 1991.
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Last updated: 7 Dec 2021
Yiyu Shen
Alumnus- Left in 2021